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Performance Enhancement of Silicon-Based Sub-Terahertz Detector by Highly Localized Plasmonic Wave in Nano-Ring FET

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dc.contributor.authorJang, E-San-
dc.contributor.authorRyu, Min Woo-
dc.contributor.authorPatel, Ramesh-
dc.contributor.authorAhn, Sang Hyo-
dc.contributor.authorHan, Ki Jin-
dc.contributor.authorKim, Kyung Rok-
dc.date.accessioned2023-04-27T14:40:56Z-
dc.date.available2023-04-27T14:40:56Z-
dc.date.issued2021-12-
dc.identifier.issn0741-3106-
dc.identifier.issn1558-0563-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/4110-
dc.description.abstractA compact monolithic trantenna (transistor-antenna) device is presented for a high-performance sub-THz wave detector using 28-nm CMOS foundry process. Based on a highly localized plasmonic wave in a silicon nano-ring field-effect transistor (FET), we obtained a total 535-fold photoresponse (Delta u) enhancement in an on-chip measurement as compared with our previous works using the same asymmetry ratio (eta(a) = 30). The inner contact diameter (d(in)) was scaleddown from 8 to 0.13 mu m for the parasitic resistance limit case. By changing the ground source from inside to outside the nano-ring FET, we could generate different Delta u polarities, which in turn reduced the junction leakage with improved vertical bar Delta u vertical bar. From a fabricated nano-ring FET with the outer ring grounded source, we observed 5x of additional vertical bar Delta u vertical bar enhancement followed by 107x with d(in) scaling. In addition, based on the highly localized plasmonic wave nano-ring FET without any external gain, a record-high free-space responsivity of 12.4 kV/W and a reduced noise equivalent power of 1 pW/Hz(0.5) were experimentally demonstrated under 0.12-THz radiation.-
dc.format.extent4-
dc.language영어-
dc.language.isoENG-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titlePerformance Enhancement of Silicon-Based Sub-Terahertz Detector by Highly Localized Plasmonic Wave in Nano-Ring FET-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/LED.2021.3119926-
dc.identifier.scopusid2-s2.0-85117849822-
dc.identifier.wosid000722001400009-
dc.identifier.bibliographicCitationIEEE ELECTRON DEVICE LETTERS, v.42, no.12, pp 1719 - 1722-
dc.citation.titleIEEE ELECTRON DEVICE LETTERS-
dc.citation.volume42-
dc.citation.number12-
dc.citation.startPage1719-
dc.citation.endPage1722-
dc.type.docTypeArticle-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusTHZ-
dc.subject.keywordPlusANTENNA-
dc.subject.keywordPlusRESPONSIVITY-
dc.subject.keywordPlusTRANSISTORS-
dc.subject.keywordPlusFREQUENCY-
dc.subject.keywordPlusDIAMOND-
dc.subject.keywordPlusDIODES-
dc.subject.keywordPlusGAN-
dc.subject.keywordAuthorMonolithic trantenna-
dc.subject.keywordAuthorsub-THz-
dc.subject.keywordAuthordetector-
dc.subject.keywordAuthornano-ring-
dc.subject.keywordAuthorfield-effect transistor (FET)-
dc.subject.keywordAuthorphotoresponse-
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