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A study on deep level defects of GaN by TSC

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dc.contributor.author강태원-
dc.date.accessioned2024-10-30T02:51:38Z-
dc.date.available2024-10-30T02:51:38Z-
dc.date.issued2000-02-24-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/37695-
dc.titleA study on deep level defects of GaN by TSC-
dc.typeConference-
dc.citation.conferenceName한국진공학회 제18회 학술발표회-
dc.citation.conferencePlace대한민국-
dc.citation.conferencePlace서울대-
dc.citation.conferenceDate2000-02-24 ~ 2000-02-25-
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