A study on deep level defects of GaN by TSC
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| DC Field |
Value |
Language |
| dc.contributor.author | 강태원 | - |
| dc.date.accessioned | 2024-10-30T02:51:38Z | - |
| dc.date.available | 2024-10-30T02:51:38Z | - |
| dc.date.issued | 2000-02-24 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/37695 | - |
| dc.title | A study on deep level defects of GaN by TSC | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 한국진공학회 제18회 학술발표회 | - |
| dc.citation.conferencePlace | 대한민국 | - |
| dc.citation.conferencePlace | 서울대 | - |
| dc.citation.conferenceDate | 2000-02-24 ~ 2000-02-25 | - |
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