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Effects of the interface traps on MOS structure based on Silicon nano-crystals
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조훈영 | - |
| dc.date.accessioned | 2024-10-30T02:11:51Z | - |
| dc.date.available | 2024-10-30T02:11:51Z | - |
| dc.date.issued | 2000-11-01 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/36511 | - |
| dc.title | Effects of the interface traps on MOS structure based on Silicon nano-crystals | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | The 10th Seoul Int. Symposium on the Physics of Semiconductors and Applications | - |
| dc.citation.conferencePlace | 대한민국 | - |
| dc.citation.conferencePlace | 제주도 | - |
| dc.citation.conferenceDate | 2000-11-01 ~ 2000-11-03 | - |
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