Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Valence band offset of Ge/Si quantum dots using optical isothermal capacitance transient spectroscopy
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조훈영 | - |
| dc.date.accessioned | 2024-10-30T01:46:40Z | - |
| dc.date.available | 2024-10-30T01:46:40Z | - |
| dc.date.issued | 2003-12-10 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/34070 | - |
| dc.title | Valence band offset of Ge/Si quantum dots using optical isothermal capacitance transient spectroscopy | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | International Conference on Advanced Materials and Devices | - |
| dc.citation.conferencePlace | 대한민국 | - |
| dc.citation.conferencePlace | Ramada Plaza, 제주 | - |
| dc.citation.conferenceDate | 2003-12-10 ~ 2003-12-12 | - |
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Natural Science > Department of Physics > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.