RF MEMS Switch using the Pull-up Structure for High Long-term Reliability and Low Actuation Voltage

이진구

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RF MEMS Switch using the Pull-up Structure for High Long-term Reliability and Low Actuation Voltage

Authors: 이진구

Issue Date: 3-Jul-2006

URI: https://scholarworks.dongguk.edu/handle/sw.dongguk/29122

Place: 일본
Tohoku University

Conference Date: 2006-07-03 ~ 2006-07-05

Conference Name: AWAD 2006

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Appears in Collections: ETC > 2. Conference Papers

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