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Photo-Depopulation of Charge Traps in Non-volatile Memory Deviced with Oxide-Nitride-Al2O3(ONA) structures
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조훈영 | - |
| dc.date.accessioned | 2024-10-30T01:15:32Z | - |
| dc.date.available | 2024-10-30T01:15:32Z | - |
| dc.date.issued | 2007-07-01 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/28220 | - |
| dc.title | Photo-Depopulation of Charge Traps in Non-volatile Memory Deviced with Oxide-Nitride-Al2O3(ONA) structures | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | International Conference on Materials for Advanced Technologies 2007 | - |
| dc.citation.conferencePlace | 싱가폴 | - |
| dc.citation.conferencePlace | Suntec Singapore International Convention Center | - |
| dc.citation.conferenceDate | 2007-07-01 ~ 2007-07-06 | - |
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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