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Electrostatic force microscopy measurements of charge trapping behaviors of Au nanoparticles embedded in metal-insulator-semiconductor structure
- Authors
- 김현정
- Issue Date
- 10-Jun-2007
- Place
- 대한민국
제주도
- Conference Date
- 2007-06-10 ~ 2007-06-14
- Conference Name
- JEJU 2007 International scanning probe microscopy confference
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Collections - ETC > 2. Conference Papers
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