Nitrogen-Doped CuO@CuS Core-Shell Structure for Highly Efficient Catalytic OER Applicationopen access
- Authors
- Ahmed, Abu Talha Aqueel; Ansari, Abu Saad; Sree, Vijaya Gopalan; Jana, Atanu; Meena, Abhishek; Sekar, Sankar; Cho, Sangeun; Kim, Hyungsang; Im, Hyunsik
- Issue Date
- Dec-2023
- Publisher
- MDPI
- Keywords
- CuO@CuS; hydrothermal growth; nitrogenation; oxygen evolution reaction; water electrolysis
- Citation
- Nanomaterials, v.13, no.24, pp 1 - 12
- Pages
- 12
- Indexed
- SCIE
SCOPUS
- Journal Title
- Nanomaterials
- Volume
- 13
- Number
- 24
- Start Page
- 1
- End Page
- 12
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/25749
- DOI
- 10.3390/nano13243160
- ISSN
- 2079-4991
2079-4991
- Abstract
- Water electrolysis is a highly efficient route to produce ideally clean H2 fuel with excellent energy conversion efficiency and high gravimetric energy density, without producing carbon traces, unlike steam methane reforming, and it resolves the issues of environmental contamination via replacing the conventional fossil fuel. Particular importance lies in the advancement of highly effective non-precious catalysts for the oxygen evolution reaction (OER). The electrocatalytic activity of an active catalyst mainly depends on the material conductivity, accessible catalytically active sites, and intrinsic OER reaction kinetics, which can be tuned via introducing N heteroatoms in the catalyst structure. Herein, the efficacious nitrogenation of CuS was accomplished, synthesized using a hydrothermal procedure, and characterized for its electrocatalytic activity towards OER. The nitrogen-doped CuO@CuS (N,CuO@CuS) electrocatalyst exhibited superior OER activity compared to pristine CuS (268 and 602 mV), achieving a low overpotential of 240 and 392 mV at a current density of 10 and 100 mA/cm2, respectively, ascribed to the favorable electronic structural modification triggered by nitrogen incorporation. The N,CuO@CuS also exhibits excellent endurance under varied current rates and a static potential response over 25 h with stability measured at 10 and 100 mA/cm2. © 2023 by the authors.
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Collections - College of Advanced Convergence Engineering > ETC > 1. Journal Articles
- College of Natural Science > Department of Physics > 1. Journal Articles
- College of Advanced Convergence Engineering > Division of System Semiconductor > 1. Journal Articles

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