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Fast Binary Matching for Edge Histogram Descriptor
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Byoul | - |
| dc.contributor.author | Won, Chee Sun | - |
| dc.date.accessioned | 2024-09-26T13:02:17Z | - |
| dc.date.available | 2024-09-26T13:02:17Z | - |
| dc.date.issued | 2014 | - |
| dc.identifier.issn | 2158-3994 | - |
| dc.identifier.issn | 2158-4001 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/25102 | - |
| dc.description.abstract | Edge histogram descriptor (EHD) consists of histogram bins of local edges in an image. Instead of the conventional bin-to-bin matching for the similarity measure, this paper presents a binary string descriptor for the EHD to achieve a faster binary bit-to-bit matching. | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | IEEE | - |
| dc.title | Fast Binary Matching for Edge Histogram Descriptor | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1109/ISCE.2014.6884396 | - |
| dc.identifier.scopusid | 2-s2.0-84907303068 | - |
| dc.identifier.wosid | 000361020200118 | - |
| dc.identifier.bibliographicCitation | 18TH IEEE INTERNATIONAL SYMPOSIUM ON CONSUMER ELECTRONICS (ISCE 2014) | - |
| dc.citation.title | 18TH IEEE INTERNATIONAL SYMPOSIUM ON CONSUMER ELECTRONICS (ISCE 2014) | - |
| dc.type.docType | Proceedings Paper | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.subject.keywordAuthor | edge histogram descriptor | - |
| dc.subject.keywordAuthor | MPEG-7 | - |
| dc.subject.keywordAuthor | Hamming distance | - |
| dc.subject.keywordAuthor | feature matching | - |
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