Cited 3 time in
Power-dependence measurement of the quality factor of superconducting microwave resonators at mK temperature
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, S.H. | - |
| dc.contributor.author | Ha, D.-G. | - |
| dc.contributor.author | Park, G.Y. | - |
| dc.contributor.author | Choi, J. | - |
| dc.contributor.author | Park, J.H. | - |
| dc.contributor.author | Song, W. | - |
| dc.contributor.author | Lee, S.G. | - |
| dc.contributor.author | Im, H. | - |
| dc.contributor.author | Kim, H. | - |
| dc.contributor.author | Chong, Y. | - |
| dc.date.accessioned | 2024-09-26T13:02:02Z | - |
| dc.date.available | 2024-09-26T13:02:02Z | - |
| dc.date.issued | 2014-09-12 | - |
| dc.identifier.issn | 0589-1485 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/25074 | - |
| dc.description.abstract | We report our setup and measurement results of the quality factor Q of superconducting microwave resonators at mK temperature in a dilution refrigerator. The power dependence of the superconducting resonators' Q was measured down to the single photon level. Measurements were performed on two types of microwave resonators. First, a half-wavelength coplanar waveguide (CPW) resonator made of niobium film on an oxidized high-resistivity silicon substrate was measured. Then a rectangular box resonator made of machined superconducting aluminum alloy was measured. While the CPW chip resonator's Q value showed noticeable decrease at low microwave power, the box resonator's Q showed little power dependence. This setup is intended to perform characterization of various microwave resonators, which will serve as key components in superconducting qubit in circuit QED architecture. © 2014 IEEE. | - |
| dc.format.extent | 2 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
| dc.title | Power-dependence measurement of the quality factor of superconducting microwave resonators at mK temperature | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.1109/CPEM.2014.6898315 | - |
| dc.identifier.scopusid | 2-s2.0-84907904381 | - |
| dc.identifier.bibliographicCitation | CPEM Digest (Conference on Precision Electromagnetic Measurements), pp 174 - 175 | - |
| dc.citation.title | CPEM Digest (Conference on Precision Electromagnetic Measurements) | - |
| dc.citation.startPage | 174 | - |
| dc.citation.endPage | 175 | - |
| dc.type.docType | Conference Paper | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.subject.keywordAuthor | dilution refrigerator | - |
| dc.subject.keywordAuthor | microwave resonator | - |
| dc.subject.keywordAuthor | power dependence | - |
| dc.subject.keywordAuthor | quality factor | - |
| dc.subject.keywordAuthor | superconducting qubit | - |
| dc.subject.keywordAuthor | two-level state | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
30, Pildong-ro 1-gil, Jung-gu, Seoul, 04620, Republic of Korea+82-2-2260-3114
Copyright(c) 2023 DONGGUK UNIVERSITY. ALL RIGHTS RESERVED.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.
