Detailed Information

Cited 3 time in webofscience Cited 3 time in scopus
Metadata Downloads

Reversible conductance switching characteristics in a polymer-In2O3 nanocrystals junction

Full metadata record
DC Field Value Language
dc.contributor.authorKim, Jongmin-
dc.contributor.authorLee, Dong Uk-
dc.contributor.authorJo, Yongcheol-
dc.contributor.authorHan, J.-
dc.contributor.authorKim, H. S.-
dc.contributor.authorInamdar, A. I.-
dc.contributor.authorJung, W.-
dc.contributor.authorIm, Hyunsik-
dc.contributor.authorKim, Eun Kyu-
dc.date.accessioned2024-09-26T11:32:14Z-
dc.date.available2024-09-26T11:32:14Z-
dc.date.issued2014-06-
dc.identifier.issn2158-3226-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/24843-
dc.description.abstractA transparent polymer-based resistive switching device containing In2O3 nanocrystals (NCs) is fabricated, and its nonvolatile memory characteristics are evaluated. Very clear reversible counter-clockwise bipolar-type resistive switching phenomena are observed. Stable retention is demonstrated. An Analysis of the temperature dependence of the bistable resistance states reveals additional features, not reported in previous studies, that the observed resistance switching is due to oxygen ions drift-induced redox reactions at the polymer/In2O3 NCs interface. The RESET and SET switching times (tau RESET and tau SET), which are defined as pulse widths extrapolated by the steepest slopes in the transition region, are tau RESET similar to 550 nsec and tau SET similar to 900 nsec. The authors propose that microscopic potential modification occurring near the polymer/In2O3 NCs boundaries plays a key role in determining resistive switching properties. (C) 2014 Author(s).-
dc.language영어-
dc.language.isoENG-
dc.publisherAMER INST PHYSICS-
dc.titleReversible conductance switching characteristics in a polymer-In2O3 nanocrystals junction-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1063/1.4884303-
dc.identifier.scopusid2-s2.0-84902449792-
dc.identifier.wosid000338995700028-
dc.identifier.bibliographicCitationAIP ADVANCES, v.4, no.6-
dc.citation.titleAIP ADVANCES-
dc.citation.volume4-
dc.citation.number6-
dc.type.docTypeArticle-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Advanced Convergence Engineering > Division of System Semiconductor > 1. Journal Articles
College of Natural Science > Department of Physics > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Inamdar, Akbar Ibrahim photo

Inamdar, Akbar Ibrahim
College of Advanced Convergence Engineering (Division of System Semiconductor)
Read more

Altmetrics

Total Views & Downloads

BROWSE