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Influence of Quantum well Thickness Fluctuation on Optical Properties of InGaN/GaN Multi Quantum well Structure Grown by PA-MBE
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Woo, Hyeonseok | - |
| dc.contributor.author | Kim, Jongmin | - |
| dc.contributor.author | Cho, Sangeun | - |
| dc.contributor.author | Jo, Yongcheol | - |
| dc.contributor.author | Roh, Cheong Hyun | - |
| dc.contributor.author | Kim, Hyungsang | - |
| dc.contributor.author | Hahn, Cheol-Koo | - |
| dc.contributor.author | Im, Hyunsik | - |
| dc.date.accessioned | 2024-09-26T10:30:43Z | - |
| dc.date.available | 2024-09-26T10:30:43Z | - |
| dc.date.issued | 2017-05 | - |
| dc.identifier.issn | 1225-8822 | - |
| dc.identifier.issn | 2288-6559 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/24517 | - |
| dc.description.abstract | An InGaN/GaN multiple quantum well (MQW) structure is grown on a GaN/sapphire template using a plasma-assisted molecular beam epitaxy (PA-MBE). The fluctuation of the quantum well thickness formed from roughly-grown InGaN layer results in a disordered photoluminescence (PL) spectrum. The surface morphologies of the InGaN layers with various In compositions are investigated by reflection high energy electron diffraction (RHEED) and atomic force microscopy (AFM). A blurred InGaN/GaN hetero-interface and the non-uniform QW size is confirmed by high resolution transmission electron microscopy (HR-TEM). Inhomogeneity of the quantum confinement results in a degradation of the quantum efficiency even though the InGaN layer has a uniform In composition. | - |
| dc.format.extent | 3 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | KOREAN VACUUM SOC | - |
| dc.title | Influence of Quantum well Thickness Fluctuation on Optical Properties of InGaN/GaN Multi Quantum well Structure Grown by PA-MBE | - |
| dc.type | Article | - |
| dc.publisher.location | 대한민국 | - |
| dc.identifier.doi | 10.5757/ASCT.2017.26.3.52 | - |
| dc.identifier.bibliographicCitation | APPLIED SCIENCE AND CONVERGENCE TECHNOLOGY, v.26, no.3, pp 52 - 54 | - |
| dc.citation.title | APPLIED SCIENCE AND CONVERGENCE TECHNOLOGY | - |
| dc.citation.volume | 26 | - |
| dc.citation.number | 3 | - |
| dc.citation.startPage | 52 | - |
| dc.citation.endPage | 54 | - |
| dc.type.docType | Article | - |
| dc.identifier.kciid | ART002228548 | - |
| dc.description.isOpenAccess | Y | - |
| dc.description.journalRegisteredClass | esci | - |
| dc.description.journalRegisteredClass | kci | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordAuthor | InGaN/GaN MQW | - |
| dc.subject.keywordAuthor | MBE | - |
| dc.subject.keywordAuthor | Hetero interface | - |
| dc.subject.keywordAuthor | Critical thickness | - |
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