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Influence of Quantum well Thickness Fluctuation on Optical Properties of InGaN/GaN Multi Quantum well Structure Grown by PA-MBE

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dc.contributor.authorWoo, Hyeonseok-
dc.contributor.authorKim, Jongmin-
dc.contributor.authorCho, Sangeun-
dc.contributor.authorJo, Yongcheol-
dc.contributor.authorRoh, Cheong Hyun-
dc.contributor.authorKim, Hyungsang-
dc.contributor.authorHahn, Cheol-Koo-
dc.contributor.authorIm, Hyunsik-
dc.date.accessioned2024-09-26T10:30:43Z-
dc.date.available2024-09-26T10:30:43Z-
dc.date.issued2017-05-
dc.identifier.issn1225-8822-
dc.identifier.issn2288-6559-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/24517-
dc.description.abstractAn InGaN/GaN multiple quantum well (MQW) structure is grown on a GaN/sapphire template using a plasma-assisted molecular beam epitaxy (PA-MBE). The fluctuation of the quantum well thickness formed from roughly-grown InGaN layer results in a disordered photoluminescence (PL) spectrum. The surface morphologies of the InGaN layers with various In compositions are investigated by reflection high energy electron diffraction (RHEED) and atomic force microscopy (AFM). A blurred InGaN/GaN hetero-interface and the non-uniform QW size is confirmed by high resolution transmission electron microscopy (HR-TEM). Inhomogeneity of the quantum confinement results in a degradation of the quantum efficiency even though the InGaN layer has a uniform In composition.-
dc.format.extent3-
dc.language영어-
dc.language.isoENG-
dc.publisherKOREAN VACUUM SOC-
dc.titleInfluence of Quantum well Thickness Fluctuation on Optical Properties of InGaN/GaN Multi Quantum well Structure Grown by PA-MBE-
dc.typeArticle-
dc.publisher.location대한민국-
dc.identifier.doi10.5757/ASCT.2017.26.3.52-
dc.identifier.bibliographicCitationAPPLIED SCIENCE AND CONVERGENCE TECHNOLOGY, v.26, no.3, pp 52 - 54-
dc.citation.titleAPPLIED SCIENCE AND CONVERGENCE TECHNOLOGY-
dc.citation.volume26-
dc.citation.number3-
dc.citation.startPage52-
dc.citation.endPage54-
dc.type.docTypeArticle-
dc.identifier.kciidART002228548-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassesci-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordAuthorInGaN/GaN MQW-
dc.subject.keywordAuthorMBE-
dc.subject.keywordAuthorHetero interface-
dc.subject.keywordAuthorCritical thickness-
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