Cited 2 time in
Enhanced ferromagnetism by preventing antiferromagnetic MnO2 in InP:Be/Mn/InP:Be triple layers fabricated using molecular beam epitaxy
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, D. J. | - |
| dc.contributor.author | Park, C. S. | - |
| dc.contributor.author | Lee, Cheol Jin | - |
| dc.contributor.author | Song, J. D. | - |
| dc.contributor.author | Koo, H. C. | - |
| dc.contributor.author | Yoon, Chong S. | - |
| dc.contributor.author | Yoon, Im Taek | - |
| dc.contributor.author | Kim, H. S. | - |
| dc.contributor.author | Kang, T. W. | - |
| dc.contributor.author | Shon, Yoon | - |
| dc.date.accessioned | 2024-09-26T09:03:12Z | - |
| dc.date.available | 2024-09-26T09:03:12Z | - |
| dc.date.issued | 2014-04 | - |
| dc.identifier.issn | 1567-1739 | - |
| dc.identifier.issn | 1878-1675 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/23945 | - |
| dc.description.abstract | The p-type InP:Be/Mn/InMnP:Be triple epilayers were prepared using MBE to increase Tc (>300 K) by preventing MnO2. After milling 1-3 nm of epilayers thickness from the top surface, the transmission electron microscopy (TEM) and X-ray diffraction (XRD) revealed no MnO2 and precipitates, and TEM and XRD results coincide with results of ferromagnetism. The enhanced ferromagnetic transition at >300 K corresponds to InMnP:Be. The increased ferromagnetic coupling without MnO2 is considered to originate from the increased p-d hybridation. These results demonstrate that InP-based ferromagnetic semiconductor layers having enhanced ferromagnetism can be formed by above process. (C) 2014 Elsevier B.V. All rights | - |
| dc.format.extent | 5 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | ELSEVIER SCIENCE BV | - |
| dc.title | Enhanced ferromagnetism by preventing antiferromagnetic MnO2 in InP:Be/Mn/InP:Be triple layers fabricated using molecular beam epitaxy | - |
| dc.type | Article | - |
| dc.publisher.location | 네델란드 | - |
| dc.identifier.doi | 10.1016/j.cap.2014.01.017 | - |
| dc.identifier.scopusid | 2-s2.0-84894263046 | - |
| dc.identifier.wosid | 000333977100007 | - |
| dc.identifier.bibliographicCitation | CURRENT APPLIED PHYSICS, v.14, no.4, pp 558 - 562 | - |
| dc.citation.title | CURRENT APPLIED PHYSICS | - |
| dc.citation.volume | 14 | - |
| dc.citation.number | 4 | - |
| dc.citation.startPage | 558 | - |
| dc.citation.endPage | 562 | - |
| dc.type.docType | Article | - |
| dc.identifier.kciid | ART001875182 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | sci | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.description.journalRegisteredClass | kci | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | NEUTRAL MANGANESE ACCEPTOR | - |
| dc.subject.keywordPlus | INP | - |
| dc.subject.keywordPlus | SEMICONDUCTORS | - |
| dc.subject.keywordAuthor | p-type InP:Be/Mn/InP:Be triple layers | - |
| dc.subject.keywordAuthor | Increased T-c | - |
| dc.subject.keywordAuthor | MBE | - |
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