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Effect of sulfur concentration on the properties of tin disulfide thin films by nebulizer spray pyrolysis technique

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dc.contributor.authorArulanantham, A. M. S.-
dc.contributor.authorValanarasu, S.-
dc.contributor.authorJeyadheepan, K.-
dc.contributor.authorKathalingam, A.-
dc.contributor.authorKulandaisamy, I.-
dc.date.accessioned2024-09-26T09:02:44Z-
dc.date.available2024-09-26T09:02:44Z-
dc.date.issued2017-12-
dc.identifier.issn0957-4522-
dc.identifier.issn1573-482X-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/23776-
dc.description.abstractInfluence of sulfur concentration variation on the physical and chemical properties of nebulizer spray pyrolysis deposited SnS2 thin films are investigated. The SnS2 thin films were coated onto glass substrate at 325 A degrees C by changing sulfur concentration as 0.8, 0.9 and 1.0 M. Sulfur concentration dependent micro-structural, surface morphological, optical and electrical characteristics of the films were studied using X-ray diffraction, Raman analysis, scanning electron microscope, atomic force microscope, UV-Vis spectroscopy, photoluminescence spectroscopy and Hall Effect measurement, respectively. X-ray diffraction measurements demonstrated the growth of crystalline SnS2 films of hexagonal structure with preferred orientation along (002) plane. Scanning electron microscopic study revealed needle shape and basket knitting shape morphology of deposited films. The films showed direct band gap ranging from 2.02 to 2.18 eV depending on sulfur concentration. Hall measurement revealed the conductivity and mobility ranging from 10(-3) to 10(-2) (1/Omega-cm) and 1.4 x 10(2) to 3.01 x 10(2) (cm(2)/V s) respectively.-
dc.format.extent11-
dc.language영어-
dc.language.isoENG-
dc.publisherSPRINGER-
dc.titleEffect of sulfur concentration on the properties of tin disulfide thin films by nebulizer spray pyrolysis technique-
dc.typeArticle-
dc.publisher.location네델란드-
dc.identifier.doi10.1007/s10854-017-7817-2-
dc.identifier.scopusid2-s2.0-85028960717-
dc.identifier.wosid000415054600043-
dc.identifier.bibliographicCitationJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.28, no.24, pp 18675 - 18685-
dc.citation.titleJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS-
dc.citation.volume28-
dc.citation.number24-
dc.citation.startPage18675-
dc.citation.endPage18685-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.subject.keywordPlusOPTICAL-PROPERTIES-
dc.subject.keywordPlusSNS2-
dc.subject.keywordPlusDEPOSITION-
dc.subject.keywordPlusBEHAVIOR-
dc.subject.keywordPlusLAYERS-
dc.subject.keywordPlusTEA-
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