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Cited 11 time in webofscience Cited 11 time in scopus
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Digital-Twin Consistency Checking Based on Observed Timed Events With Unobservable Transitions in Smart Manufacturingopen access

Authors
Seok, Moon GiTan, Wen JunCai, WentongPark, Daejin
Issue Date
Apr-2023
Publisher
IEEE
Keywords
Manufacturing; Stochastic processes; Runtime; Production; Smart manufacturing; Monitoring; Informatics; Digital twin (DT); manufacturing system; reachability analysis; state-class graph (SCG); time petri net (TPN)
Citation
IEEE Transactions on Industrial Informatics, v.19, no.4, pp 6208 - 6219
Pages
12
Indexed
SCIE
SCOPUS
Journal Title
IEEE Transactions on Industrial Informatics
Volume
19
Number
4
Start Page
6208
End Page
6219
URI
https://scholarworks.dongguk.edu/handle/sw.dongguk/22489
DOI
10.1109/TII.2022.3200598
ISSN
1551-3203
1941-0050
Abstract
Smart factories manage digital twins (DTs) to evaluate the performance of various what-if production scenarios. This article presents a DT consistency-checking approach to maintain DT in high fidelity by checking whether each sensed timed event from the physical manufacturing plant is under its corresponding DT-based estimations in runtime. The approach targets DTs developed using time colored Petri net (TCPN). To build the candidates of the next observable event with observable time margins, we considered the stochastic property of the plant, frequent external actuation caused by a new order, machine maintenance, etc., as well as intermediate unobservable state transitions reaching the sensible events. Based on the considerations, we propose an iterative method to build the virtual estimates for streaming physical events using efficiently evolved state-class graphs (SCGs). We also propose a TCPN partitioning method to accelerate the SCG-evolution and make DT maintenance easier by supporting the isolation of inconsistent subnets being diagnosed. We applied the approach to a USB flash-drive factory to prove the concept and evaluated the performance under various situations to show speedups of the SCG evolution, that is the crucial overhead of the estimation.
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