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Millimeter-Wave Small-Signal Model Using A Coplanar Waveguide De-Embedded Sub-Model for HEMT

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dc.contributor.authorTung The-Lam Nguyen-
dc.contributor.authorKim, Sam-Dong-
dc.date.accessioned2024-08-08T06:01:47Z-
dc.date.available2024-08-08T06:01:47Z-
dc.date.issued2014-02-
dc.identifier.issn1531-1309-
dc.identifier.issn1558-1764-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/18840-
dc.description.abstractWe propose in this study an approach to highly reliable extraction method for parasitic elements of the 0.1 mu m GaAs metamorphic high electron mobility transistors. This method utilizes the de-embedding scheme for the coplanar waveguide (CPW) feeding structure by considering the distributed extrinsic parasitic elements in our small-signal model. The parasitic extrinsic capacitances are determined by modeling a PI equivalent circuit including the interaction between the sub-model (the model after de-embedding) and the CPW feedings. Extractions for 2 x 10 mu m, 2 x 20 mu m, 2 x 30 mu m, and 2 x 70 mu m), and our S-parameter prediction shows the best agreement with the measurements in a frequency range of 0.5-110 GHz (0.5 GHz step) among the small-signal models reported to date.-
dc.format.extent3-
dc.language영어-
dc.language.isoENG-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleMillimeter-Wave Small-Signal Model Using A Coplanar Waveguide De-Embedded Sub-Model for HEMT-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/LMWC.2013.2290214-
dc.identifier.scopusid2-s2.0-84896720565-
dc.identifier.wosid000331953800011-
dc.identifier.bibliographicCitationIEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.24, no.2, pp 99 - 101-
dc.citation.titleIEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS-
dc.citation.volume24-
dc.citation.number2-
dc.citation.startPage99-
dc.citation.endPage101-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusDEVICES-
dc.subject.keywordAuthorField effect transistors (FETs)-
dc.subject.keywordAuthorlinear and non-linear device modeling-
dc.subject.keywordAuthormicrowave device characterization and measurements-
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