Cited 8 time in
Millimeter-Wave Small-Signal Model Using A Coplanar Waveguide De-Embedded Sub-Model for HEMT
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Tung The-Lam Nguyen | - |
| dc.contributor.author | Kim, Sam-Dong | - |
| dc.date.accessioned | 2024-08-08T06:01:47Z | - |
| dc.date.available | 2024-08-08T06:01:47Z | - |
| dc.date.issued | 2014-02 | - |
| dc.identifier.issn | 1531-1309 | - |
| dc.identifier.issn | 1558-1764 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/18840 | - |
| dc.description.abstract | We propose in this study an approach to highly reliable extraction method for parasitic elements of the 0.1 mu m GaAs metamorphic high electron mobility transistors. This method utilizes the de-embedding scheme for the coplanar waveguide (CPW) feeding structure by considering the distributed extrinsic parasitic elements in our small-signal model. The parasitic extrinsic capacitances are determined by modeling a PI equivalent circuit including the interaction between the sub-model (the model after de-embedding) and the CPW feedings. Extractions for 2 x 10 mu m, 2 x 20 mu m, 2 x 30 mu m, and 2 x 70 mu m), and our S-parameter prediction shows the best agreement with the measurements in a frequency range of 0.5-110 GHz (0.5 GHz step) among the small-signal models reported to date. | - |
| dc.format.extent | 3 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
| dc.title | Millimeter-Wave Small-Signal Model Using A Coplanar Waveguide De-Embedded Sub-Model for HEMT | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1109/LMWC.2013.2290214 | - |
| dc.identifier.scopusid | 2-s2.0-84896720565 | - |
| dc.identifier.wosid | 000331953800011 | - |
| dc.identifier.bibliographicCitation | IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.24, no.2, pp 99 - 101 | - |
| dc.citation.title | IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | - |
| dc.citation.volume | 24 | - |
| dc.citation.number | 2 | - |
| dc.citation.startPage | 99 | - |
| dc.citation.endPage | 101 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | sci | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.subject.keywordPlus | DEVICES | - |
| dc.subject.keywordAuthor | Field effect transistors (FETs) | - |
| dc.subject.keywordAuthor | linear and non-linear device modeling | - |
| dc.subject.keywordAuthor | microwave device characterization and measurements | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
30, Pildong-ro 1-gil, Jung-gu, Seoul, 04620, Republic of Korea+82-2-2260-3114
Copyright(c) 2023 DONGGUK UNIVERSITY. ALL RIGHTS RESERVED.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.
