Cited 26 time in
Ultraviolet photoresponse of ZnO nanostructured AlGaN/GaN HEMTs
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Dogar, Salahuddin | - |
| dc.contributor.author | Khan, Waciar | - |
| dc.contributor.author | Kim, Sam-Dong | - |
| dc.date.accessioned | 2024-08-08T05:30:37Z | - |
| dc.date.available | 2024-08-08T05:30:37Z | - |
| dc.date.issued | 2016-03-15 | - |
| dc.identifier.issn | 1369-8001 | - |
| dc.identifier.issn | 1873-4081 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/18590 | - |
| dc.description.abstract | We present the first active visible blind ultraviolet (UV) photodetector based on zinc oxide (ZnO) nanostructured AIGaN/GaN high electron mobility transistors (HEMTs). The ZnO nanorods (NRs) are selectively grown on the gate area by using hydrothermal method. It is shown that ZnO nanorod (NR)-gated UV detectors exhibit much superior performance in terms of response speed and recovery time to those of seed-layer-gated detectors. It is also found that the best response speed (similar to 10 and similar to 190 ms) and responsivity (similar to 1.1 x 10(5) A/W) were observed from detectors of the shortest gate length of 2 mu m among our NR-gated devices of three different gate dimensions, and this responsivity is about one order higher than the best performance of ZnO NR-based UV detectors reported to date. (C) 2016 Elsevier Ltd. All rights reserved. | - |
| dc.format.extent | 7 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | ELSEVIER SCI LTD | - |
| dc.title | Ultraviolet photoresponse of ZnO nanostructured AlGaN/GaN HEMTs | - |
| dc.type | Article | - |
| dc.publisher.location | 영국 | - |
| dc.identifier.doi | 10.1016/j.mssp.2016.01.004 | - |
| dc.identifier.scopusid | 2-s2.0-84954461426 | - |
| dc.identifier.wosid | 000371556300011 | - |
| dc.identifier.bibliographicCitation | MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, v.44, pp 71 - 77 | - |
| dc.citation.title | MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING | - |
| dc.citation.volume | 44 | - |
| dc.citation.startPage | 71 | - |
| dc.citation.endPage | 77 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | sci | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
| dc.subject.keywordPlus | THIN-FILMS | - |
| dc.subject.keywordPlus | PHOTODETECTORS | - |
| dc.subject.keywordPlus | GROWTH | - |
| dc.subject.keywordPlus | TEMPERATURE | - |
| dc.subject.keywordPlus | PERFORMANCE | - |
| dc.subject.keywordPlus | FABRICATION | - |
| dc.subject.keywordAuthor | UV detector | - |
| dc.subject.keywordAuthor | ZnO nanorods | - |
| dc.subject.keywordAuthor | AlGaN/GaN HEMT | - |
| dc.subject.keywordAuthor | High responsivity | - |
| dc.subject.keywordAuthor | Gate length effect | - |
| dc.subject.keywordAuthor | Response speed | - |
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