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Facile Route to NiO Nanostructured Electrode Grown by Oblique Angle Deposition Technique for Supercapacitors

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dc.contributor.authorKannan, Vasudevan-
dc.contributor.authorInamdar, Akbar I.-
dc.contributor.authorPawar, Sambaji M.-
dc.contributor.authorKim, Hyun-Seok-
dc.contributor.authorPark, Hyun-Chang-
dc.contributor.authorKim, Hyungsang-
dc.contributor.authorIm, Hyunsik-
dc.contributor.authorChae, Yeon Sik-
dc.date.accessioned2024-08-08T04:31:37Z-
dc.date.available2024-08-08T04:31:37Z-
dc.date.issued2016-07-13-
dc.identifier.issn1944-8244-
dc.identifier.issn1944-8252-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/18051-
dc.description.abstractWe report an efficient method for growing NiO nanostructures by oblique angle deposition (OAD) technique in an e-beam evaporator for supercapacitor applications. This facile physical vapor deposition technique combined with OAD presents a unique, direct, and economical route for obtaining high width-to-height ratio nanorods for super capacitor electrodes. The NiO nanostructure essentially consists of nanorods with varying dimensions. The sample deposited at OAD 75 degrees showed highest supercapacitance value of 344 F/g. NiO nanorod electrodes exhibits excellent electrochemical stability with no degradation in capacitance after 5000 charge discharge cycles. The nanostructured film adhered well to the substrate and had 131% capacity retention. Peak energy density and power density of the NiO nanorods were 8.78 Wh/kg and 2.5 kW/kg, respectively. This technique has potential to be expanded for growing nanostructured films of other interesting metal/metal oxide candidates for supercapacitor applications.-
dc.format.extent6-
dc.language영어-
dc.language.isoENG-
dc.publisherAMER CHEMICAL SOC-
dc.titleFacile Route to NiO Nanostructured Electrode Grown by Oblique Angle Deposition Technique for Supercapacitors-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1021/acsami.6b03714-
dc.identifier.scopusid2-s2.0-84978829843-
dc.identifier.wosid000379794100024-
dc.identifier.bibliographicCitationACS APPLIED MATERIALS & INTERFACES, v.8, no.27, pp 17220 - 17225-
dc.citation.titleACS APPLIED MATERIALS & INTERFACES-
dc.citation.volume8-
dc.citation.number27-
dc.citation.startPage17220-
dc.citation.endPage17225-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.subject.keywordPlusNICKEL-OXIDE-
dc.subject.keywordPlusELECTROCHEMICAL CAPACITORS-
dc.subject.keywordPlusASYMMETRIC SUPERCAPACITOR-
dc.subject.keywordPlusHYDROTHERMAL METHOD-
dc.subject.keywordPlusSURFACE-DIFFUSION-
dc.subject.keywordPlusNANOWIRE ARRAYS-
dc.subject.keywordPlusHYDROUS RUO2-
dc.subject.keywordPlusFUEL-CELLS-
dc.subject.keywordPlusTHIN-FILMS-
dc.subject.keywordPlusGENERATION-
dc.subject.keywordAuthorelectrochemical supercapacitor-
dc.subject.keywordAuthorNiO-
dc.subject.keywordAuthoroblique angle deposition-
dc.subject.keywordAuthornanostructures-
dc.subject.keywordAuthore-beam evaporation-
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College of Engineering > Department of Electronics and Electrical Engineering > 1. Journal Articles
College of Natural Science > Department of Physics > 1. Journal Articles
College of Advanced Convergence Engineering > Division of System Semiconductor > 1. Journal Articles

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