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Device Process and Circuit Application Interaction for Harsh Electronics: Hf-In-Zn-O Thin Film Transistors as an Exampleopen access

Ho, Chih-Hsiang; Tsai, Dung-Sheng; Lu, Chao; Kim, Soo Youn; Mungan, Selin; Yang, Shih-Guo; Zhang, Yuanzhi; He, Jr-Hau

ArticleIssue Date2017CitationIEEE ELECTRON DEVICE LETTERS, v.38, no.8, pp 1039 - 1042PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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