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Defect-Engineered Monolayer MoS2 via Chemical Etching: A Facile Route to Study SERS Sensitivityopen access

Khadka, Ishwor Bahadur; Gaurav, Kumar; Adhikari, Puspa Raj; Lee, Jinho; Kim, Miseon; Ha, Yongmo; Srivastava, Anurag; Jang, Jae-Won

ArticleIssue Date2026CitationSmall Methods, v.10, no.4PublisherWiley-VCH GmbH
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