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Incidence and root cause analysis of near-miss events in medical device use errors in intensive care units using Ishikawa diagramopen access

Seong, Su-mi; Oh, Hyeop; Park, Jae Suk; Bae, Su Hyun; Nam, Ki Chang; Park, Sung Yun; Kwon, Bum Sun; Kim, Bo Hae

ArticleIssue Date2025CitationJapan Journal of Nursing Science, v.22, no.4PublisherJohn Wiley & Sons Australia, Ltd
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