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Browsing by Park, Jae HyeonAuthor

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Showing results 1 to 14 of 14

SCIESCOPUS
A Generative Adversarial Network-Based Image Denoiser Controlling Heterogeneous Lossesopen access

Cho, Sung In; Park, Jae Hyeon; Kang, Suk-Ju

ArticleIssue Date2021CitationSENSORS, v.21, no.4, pp 1 - 17PublisherMDPI
SCIESCOPUS
Adversarial representation teaching with perturbation-agnostic student-teacher structure for semi-supervised learning

Park, Jae Hyeon; Kim, Ju Hyun; Ngo, Ba Hung; Kwon, Jung Eun; Cho, Sung In

ArticleIssue Date2023CitationApplied Intelligence, v.53, no.22, pp 26797 - 26809PublisherSPRINGER
SCIESCOPUS
Anthropometric Landmark Detection Network via Geodesic Heatmap on 3D Human Scanopen access

Cha, Min Hee; Park, Jae Hyeon; Byun, Ji Sun; Ahn, Sangyeon; Lee, Gyoomin; Yoon, Seung Hyun; Cho, Sung In

ArticleIssue Date2024CitationIEEE Access, v.12, pp 197035 - 197047PublisherIEEE
SCIESCOPUS
Context and scale-aware YOLO for welding defect detectionopen access

Kwon, Jung Eun; Park, Jae Hyeon; Kim, Ju Hyun; Lee, Yun Hak; Cho, Sung In

ArticleIssue Date2023CitationNDT & E International, v.139, pp 1 - 9PublisherElsevier Ltd
SCIESCOPUS
DCID: A divide and conquer approach to solving the trade-off problem between artifacts caused by enhancement procedure in image downscaling

Kang, Eun Su; Chae, Yeon Jeong; Park, Jae Hyeon; Cho, Sung In

ArticleIssue Date2024CitationSignal Processing: Image Communication, v.126, pp 1 - 11PublisherElsevier BV
FOREIGN
Distilling and Refining Domain-Specific Knowledge for Semi-Supervised Domain Adaptation

Kim, Ju Hyun; Ngo, Ba Hung; Park, Jae Hyeon; Kwon, Jung Eun; Lee, Ho Sub; Cho, Sung In

ArticleIssue Date2022CitationBMVC 2022 - 33rd British Machine Vision Conference Proceedings, pp 1 - 14PublisherBritish Machine Vision Association, BMVA
SCOPUS
Dynamic Pseudo Labeling via Gradient Cutting for High-Low Entropy Explorationopen access

Park, Jae Hyeon; Jeon, Joo Hyeon; Lee, Jae Yun; Ahn, Sangyeon; Cha, Min Hee; Kim, Min Geol; Nam, Hyeok; Cho, Sung In

ArticleIssue Date2025Citation2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp 20602 - 20611PublisherIEEE
SCIESCOPUS
Easy-to-Hard Structure for Remote Sensing Scene Classification in Multitarget Domain Adaptationopen access

Ngo, Ba Hung; Chae, Yeon Jeong; Park, Jae Hyeon; Kim, Ju Hyun; Cho, Sung In

ArticleIssue Date2023CitationIEEE Transactions on Geoscience and Remote Sensing, v.61PublisherIEEE
SCIESCOPUS
Flow analysis-based fast-moving flow calibration for a people-counting system

Park, Jae Hyeon; Cho, Sung In

ArticleIssue Date2021CitationMULTIMEDIA TOOLS AND APPLICATIONS, v.80, no.21-23, pp 31671 - 31685PublisherSPRINGER
SCIESCOPUS
Human visual system-based perceptual Mura index for quantitative Mura evaluation

Park, Jae Hyeon; Kim, Ju Hyun; Ngo, Ba Hung; Kwon, Jung Eun; Park, Seunggi; Byun, Ji Sun; Cho, Sung In

ArticleIssue Date2024CitationMeasurement: Journal of the International Measurement Confederation, v.227, pp 1 - 15PublisherElsevier BV
SCOPUS
Improved Knowledge Transfer for Semi-supervised Domain Adaptation via Trico Training Strategyopen access

Ngo, Ba Hung; Chae, Yeon Jeong; Kwon, Jung Eun; Park, Jae Hyeon; Cho, Sung In

ArticleIssue Date2023Citation2023 IEEE/CVF International Conference on Computer Vision (ICCV), pp 19157 - 19166PublisherIEEE
SCOPUS
Not All Classes Stand on Same Embeddings: Calibrating a Semantic Distance with Metric Tensor

Park, Jae Hyeon; Lee, Gyoomin; Park, Seunggi; Cho, Sung In

ArticleIssue Date2024Citation2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp 17722 - 17731PublisherIEEE
SCIESCOPUS
Online Hand Gesture Recognition Using Semantically Interpretable Attention Mechanismopen access

Chae, Moon Ju; Han, Sang Hoon; Nam, Hyeok; Park, Jae Hyeon; Cha, Min Hee; Cho, Sung In

ArticleIssue Date2025CitationIEEE Access, v.13, pp 32329 - 32340PublisherIEEE
SCIESCOPUS
Semi-Supervised Domain Adaptation Using Explicit Class-Wise Matching for Domain-Invariant and Class-Discriminative Feature Learningopen access

Ngo, Ba Hung; Park, Jae Hyeon; Cho, Sung In

ArticleIssue Date2021CitationIEEE ACCESS, v.9, pp 128467 - 128480PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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