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Investigation on mechanism for instability under drain current stress in amorphous Si-In-Zn-O thin-film transistors

Kim, Do Hyung; Jung, Hyun Kwang; Yang, Woochul; Kim, Dae Hwan; Lee, Sang Yeol

ArticleIssue Date2013CitationTHIN SOLID FILMS, v.527, pp 314 - 317PublisherELSEVIER SCIENCE SA
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